Offset determination for measurement system matching

ABSTRACT

Dynamic offset determination for each of a plurality of measurement systems for matching the systems is disclosed. One embodiment uses an artifact which is periodically run across the measurement system to be matched. Inputs for each run include the current offsets and historical data for the entire fleet and the new test measurement for the current measurement system under test. Evaluation based on exponentially weighted moving average and median calculation techniques may result in a new, reset offset for one or more measurement systems. The reset offset(s) is then applied to product measurements to nullify any tool matching issues.

This application is a continuation of application Ser. No. 11/163,009,filed Sep. 30, 2005, currently issued.

BACKGROUND OF THE INVENTION

1. Technical Field

The invention relates generally to measurement systems, and moreparticularly, to a method, system and program product to determine adynamic offset for measurement system matching.

2. Background Art

Efficient semiconductor manufacturing requires highly precise andaccurate measurement systems, i.e., metrology instruments. Inparticular, a measurement system is required to achieve small tolerancesto achieve better quality products and fewer rejections in themanufacturing process. There are a number of challenges currently facingthe industry relative to measurement systems. One challenge is correctlyassessing the measurement potential of a measurement system and matchingthe measurement system to other measurement systems. Conventionally,when a stable artifact (NIST traceable) is not available, a plurality ofmeasurement systems are matched by having each system test measuring aparticular artifact on a monitor wafer, and then determining an offsetfor each measurement system from a median of all of the measurementsystems test measurements. An offset is a correction value, e.g., −2.2nm, for each measurement. A monitor wafer is a wafer used formeasurement testing that includes “artifacts” or structures having ameasurable dimension, e.g., thickness, thereon. Typically, artifacts ona monitor wafer are generated to represent variations in a particularsemiconductor process of interest for the particular measurement systemunder test (MSUT). Unfortunately, it is oftentimes difficult to separatethe inherent noise associated with the measurement systems data fromreal process excursions with a high confidence level. As a result,offsets for a measurement system are oftentimes inaccurate. One approachto address the matching problem has been to limit the measurementsystems on which a critical dimension is measured during production.Even though this approach results in more uniform measurements, thissolution is not desirable because it reduces throughput and increasesthe risk to a production line by the use of a limited number ofmeasurement systems to support a potentially critical process.

Another challenge relative to measurement system matching is addressingchanges in artifacts on monitor wafers over time, which frustrates theability to match measurement systems. For example, in the semiconductorindustry the thickness of a thin-gate oxide film on the surface of asilicon wafer is known to change over time due to environmentalconditions. As a result, measurements of an artifact made of thatmaterial changes over time, and creates inaccuracies for staticmeasurement system offsets.

In view of the foregoing, there is a need in the art for a solution tothe problems presented by the related art.

SUMMARY OF THE INVENTION

Dynamic offset determination for each of a plurality of measurementsystems for matching the systems is disclosed. One embodiment uses anartifact which is periodically run across the measurement system to bematched. Inputs for each run include the current offsets and historicaldata for the entire fleet and the new test measurement for the currentmeasurement system under test. Evaluation based on exponentiallyweighted moving average and median calculation techniques may result ina new, reset offset for one or more measurement systems. The resetoffset(s) is then applied to product measurements to nullify any toolmatching issues.

A first aspect of the invention provides a method of determining anoffset for each of a plurality of measurement systems, the methodcomprising the steps of: obtaining a set of test measurements of anartifact on a monitor wafer for each of the plurality of measurementsystems, and a current offset for each measurement system; measuring theartifact on a measurement system under test (MSUT) to obtain a new testmeasurement; adding the new test measurement to the set of testmeasurements for the MSUT; calculating an exponentially weighted movingaverage (EWMA) of each measurement system based on their respective setsof test measurements; calculating for each measurement system a primevalue equal to the EWMA of a respective measurement system plus thecurrent offset of the respective measurement system; calculating amedian of the prime values for the plurality of measurement systems as agroup; calculating for each measurement system, a delta-to-median valueequal to the prime value for the respective measurement system minus themedian; and resetting the current offset for each respective measurementsystem to a reset offset equal to the current offset for a respectivemeasurement system minus the delta-to-median for the respectivemeasurement system in response to the delta-to-median value for therespective measurement system exceeding a predetermined threshold.

A second aspect of the invention provides a system for determining anoffset for each of a plurality of measurement systems, the systemcomprising: means for obtaining a set of test measurements of anartifact on a monitor wafer for each of the plurality of measurementsystems, and a current offset for each measurement system; means formeasuring the artifact on a measurement system under test (MSUT) toobtain a new test measurement; means for adding the new test measurementto the set of test measurements for the MSUT; means for calculating anexponentially weighted moving average (EWMA) of each measurement systembased on their respective sets of test measurements; means forcalculating for each measurement system a prime value equal to the EWMAof a respective measurement system plus the current offset of therespective measurement system; means for calculating a median of theprime values for the plurality of measurement systems as a group; meansfor calculating for each measurement system, a delta-to-median valueequal to the prime value for the respective measurement system minus themedian; and means for resetting the current offset for each respectivemeasurement system to a reset offset equal to the current offset for arespective measurement system minus the delta-to-median for therespective measurement system in response to the delta-to-median valuefor the respective measurement system exceeding a predeterminedthreshold.

A third aspect of the invention provides a program product stored on acomputer-readable medium, which when executed, determines an offset foreach of a plurality of measurement systems, the program productcomprising: program code for obtaining a set of test measurements of anartifact on a monitor wafer for each of the plurality of measurementsystems, and a current offset for each measurement system; program codefor measuring the artifact on a measurement system under test (MSUT) toobtain a new test measurement; program code for adding the new testmeasurement to the set of test measurements for the MSUT; program codefor calculating an exponentially weighted moving average (EWMA) of eachmeasurement system based on their respective sets of test measurements;program code for calculating for each measurement system a prime valueequal to the EWMA of a respective measurement system plus the currentoffset of the respective measurement system; program code forcalculating a median of the prime values for the plurality ofmeasurement systems as a group; program code for calculating for eachmeasurement system, a delta-to-median value equal to the prime value forthe respective measurement system minus the median; and program code forresetting the current offset for each respective measurement system to areset offset equal to the current offset for a respective measurementsystem minus the delta-to-median for the respective measurement systemin response to the delta-to-median value for the respective measurementsystem exceeding a predetermined threshold.

A fourth aspect of the invention provides a computer-readable mediumthat includes computer program code to enable a computer infrastructureto determine an offset for each of a plurality of measurement systems,the computer-readable medium comprising computer program code forperforming the method steps of the invention.

An fifth aspect of the invention provides a business method fordetermining an offset for each of a plurality of measurement systems,the business method comprising managing a computer infrastructure thatperforms each of the steps of the invention; and receiving payment basedon the managing step.

A sixth aspect of the invention provides a method of generating a systemfor determining an offset for each of a plurality of measurementsystems, the method comprising: obtaining a computer infrastructure; anddeploying means for performing each of the steps of the invention to thecomputer infrastructure.

The illustrative aspects of the present invention are designed to solvethe problems herein described and other problems not discussed, whichare discoverable by a skilled artisan.

BRIEF DESCRIPTION OF THE DRAWINGS

These and other features of this invention will be more readilyunderstood from the following detailed description of the variousaspects of the invention taken in conjunction with the accompanyingdrawings that depict various embodiments of the invention, in which:

FIG. 1 shows a block diagram of an illustrative environment according tothe invention.

FIGS. 2A-B show a flow diagram illustrating one embodiment of a methodof operation of the offset determining system of FIG. 1.

FIG. 3 shows a graph of old test measurement mean average versus timeaccording to prior art.

FIG. 4 shows a graph of test measurement mean average versus timeaccording to the invention.

It is noted that the drawings of the invention are not to scale. Thedrawings are intended to depict only typical aspects of the invention,and therefore should not be considered as limiting the scope of theinvention. In the drawings, like numbering represents like elementsbetween the drawings.

DETAILED DESCRIPTION

Turning to the drawings, FIG. 1 shows an illustrative environment 100for determining an offset for each measurement system 90 with aplurality of measurement systems 91. A particular measurement system 90under evaluation is referred to herein as a measurement system undertest (MSUT) 90. Each measurement system 90 may include one or moremetrology tools such as a scanning electron microscope (SEM), atomicforce microscope (AFM), etc. It should be recognized, however, that theteachings of the invention are applicable to any type of measurementsystem and plurality of different types of measurement systems. Asshown, each measurement system 90 may include an offset 92, whichestablishes a correction value for each measurement the particularmeasurement system makes, and a set of test measurements 94 of anartifact 96 of a monitor wafer 98. As will be described below, eachmeasurement system 90 measures an artifact 96 on a monitor wafer 98 toobtain a test measurement. As used herein, an “artifact” is a structureon monitor wafer 98 having a measurable dimension, e.g., thickness,width, etc. Monitor wafer 98 may be exposed to atmospheric environment,which may alter artifact 96 thereon.

Environment 100 includes a computer infrastructure 102 that can performthe various process steps described herein for increasing powerstability in an IC. In particular, computer infrastructure 102 is shownincluding a computing device 104 that comprises an offset determiningsystem 106, which enables computing device 104 to determine an offsetfor each of a plurality of measurement systems by performing the processsteps of the invention.

Computing device 104 is shown including a memory 112, a processor 114,an input/output (I/O) interface 116, and a bus 118. Further, computingdevice 104 is shown in communication with an external I/Odevice/resource 120 and a storage system 122. As is known in the art, ingeneral, processor 114 executes computer program code, such as offsetdetermining system 106, that is stored in memory 112 and/or storagesystem 122. While executing computer program code, processor 114 canread and/or write data, such as sets of test measurement data 124 and/oroffsets 126, to/from memory 112, storage system 122, and/or I/Ointerface 116. Bus 118 provides a communications link between each ofthe components in computing device 104. I/O device 118 can comprise anydevice that enables a user to interact with computing device 104 or anydevice that enables computing device 104 to communicate with one or moreother computing devices.

In any event, computing device 104 can comprise any general purposecomputing article of manufacture capable of executing computer programcode installed by a user (e.g., a personal computer, server, handhelddevice, etc.). However, it is understood that computing device 104 andoffset determining system 106 are only representative of variouspossible equivalent computing devices that may perform the variousprocess steps of the invention. To this extent, in other embodiments,computing device 104 can comprise any specific purpose computing articleof manufacture comprising hardware and/or computer program code forperforming specific functions, any computing article of manufacture thatcomprises a combination of specific purpose and general purposehardware/software, or the like. In each case, the program code andhardware can be created using standard programming and engineeringtechniques, respectively.

Similarly, computer infrastructure 102 is only illustrative of varioustypes of computer infrastructures for implementing the invention. Forexample, in one embodiment, computer infrastructure 102 comprises two ormore computing devices (e.g., a server cluster) that communicate overany type of wired and/or wireless communications link, such as anetwork, a shared memory, or the like, to perform the various processsteps of the invention. When the communications link comprises anetwork, the network can comprise any combination of one or more typesof networks (e.g., the Internet, a wide area network, a local areanetwork, a virtual private network, etc.). Regardless, communicationsbetween the computing devices may utilize any combination of varioustypes of transmission techniques.

As previously mentioned and discussed further below, offset determiningsystem 106 enables computing infrastructure 102 to determine an offsetfor each of a plurality of measurement systems. In one embodiment, asshown, offset determining system 106 includes a program product storedin memory 112, including a data obtainer 130, a measurer 132, an adder134, an exponentially weighted moving average (EWMA) calculator 136, aprime value calculator 138, a median calculator 139, a delta-to-median(delta-median) calculator 140, an offset resetter 142, an identifier144, and other system components (other sys. comp.) 146. Other systemcomponents 146 may include any other peripheral functionality requiredfor operation of system 106, but not expressly stated below. Forexample, a data filter to filter outliers from the raw data prior toprocessing. Operation of each of these functions is discussed furtherbelow. However, it is understood that some of the various functionsshown in FIG. 1 can be implemented independently, combined, and/orstored in memory for one or more separate computing devices that areincluded in computer infrastructure 102. Further, it is understood thatsome of the functions may not be implemented, or additional systemsand/or functionality may be included as part of environment 100.

Referring to FIGS. 2A-B in conjunction with FIG. 1, one embodiment of amethod of operation of offset determining system 106 will now bedescribed. In a first step S1, data obtainer 130 obtains a set of testmeasurements 94 of artifact 96 on monitor wafer 98 for each of theplurality of measurement systems 90, and a current offset 92 for eachmeasurement system 90. Data obtainer 130 may obtain this data in any nowknown or later developed fashion. In one embodiment, data obtainer 130may instruct recall of this data from each measurement system 90individually, or it may recall this data from a collective storage suchas storage system 122, i.e., set of test measurement data 124 andcurrent offsets 126. It should be recognized that the data obtainingstep may be segregated, if desired. The set of test measurements 124 mayinclude any number of test measurements considered sufficient to obtainan understanding of a measurement system's operations. In oneembodiment, the set of test measurements 124 includes three testmeasurements.

In a second step S2, measurer 132 measures artifact 96 on the MSUT 90 toobtain a new test measurement, i.e., measurer 132 instructs the MSUT 90to measure the artifact 96.

In a third step S3, adder 134 adds the new test measurement to the setof test measurements 124 for MSUT 90. For example, for a set of threetest measurements, of which one is 4 days old, another is 3 days old andanother is 2 days old, the new one that is current is added. As aresult, the set of test measurements 124 would include test measurementsthat are 4, 3 and 2 days old and one that is current. In one preferredembodiment, each set of test measurements 124 includes at least threetest measurements. The number of test measurements used, however, may beselected by a user. In addition, a user may select a maximum age of thetest measurements used. Where the number of test measurements is lowerthan required, the artifact may be re-run multiple times as needed toobtain the minimum number of test measurements. The artifact may also bere-run multiple times following tool maintenance or an observed toolshift, etc., even if the data is not past the limit of the maximum ageof data that can be used.

In a fourth step S4, exponentially weighted moving average (EWMA)calculator 136 calculates an EWMA of each measurement system based ontheir respective sets of test measurements 124. An EWMA is a movingaverage in which greater weight is given to more recent data. As aresult, the EWMA represents an average that includes more recentmovement, as opposed to assuming an unbiased view. For example, an EWMAmay weigh a third, oldest test measurement 10%, a second oldest testmeasurement 30% and the first, new test measurement 60%. In thisfashion, the new test measurement is given more weight than the oldertest measurements. In some cases, some of the test measurements, e.g.,the 4 day old test measurement in the example above, may be ignored.Lambda (λ) is value that helps determine weighting factor, and may beuser selected based on, for example, at least one of artifact 96 andMSUT 90. Since the details of EWMA calculation are known to those in theskill are known, no further description should be necessary.

In step S5, prime value calculator 138 calculates for each measurementsystem 90 a value, referred to herein as a ‘prime value,’ equal to theEWMA of a respective measurement system plus the current offset of therespective measurement system.

In step S6, median calculator 139 calculates a median of the primevalues for all of the measurement systems in a fleet as a group, i.e.,the median of all of the prime values.

In step S7, delta-to-median calculator 140 calculates for eachmeasurement system, a delta-to-median value equal to the prime value forthe respective measurement system minus the median of the prime values.

In step S8, as shown in FIG. 2B, offset resetter 142 determines whetherthe delta-to-median value for each respective measurement system exceedsa predetermined threshold. The predetermined threshold may be userdefined and may vary depending on the type of measurement system. If thedelta-to-median value exceeds the predetermined threshold, i.e., YES atstep S8, then at step S9, offset resetter 142 resets the current offsetfor the respective measurement to a reset offset equal to the currentoffset for the respective measurement system minus the delta-to-medianfor the respective measurement system. Processing then proceeds to stepS11, described below. In contrast, if the delta-to-median value does notexceed the predetermined threshold, i.e., NO at step S8, then at stepS10, offset resetter 142 maintains the current offset for the respectivemeasurement system, i.e., the offset resetter 142 does nothing. In theabove-described manner, based on a test measurement for MSUT 90, theoffset for each measurement system of the plurality of measurementsystems 91 can be changed to maintain matching of the systems.

Steps S11-S14 represent optional steps of the method that identify anymeasurement systems for non-use. Steps S11-S12 and/or steps S13-S14 canbe provided. Steps S11-S12 and steps S13-14 may also be switched inorder. In step S11-S14, identifier 144 identifies a measurement systemfor non-use in response to at least one of the following: a) adifference of the current offset and the reset offset of the measurementsystem exceeding an offset difference threshold, and b) thedelta-to-median of the measurement system exceeding a delta-to-medianthreshold. An offset difference may exceed the difference threshold anda delta-to-median value may exceed a delta-to-median threshold for anumber of reasons such as gradual drifting from its previous calibrationsettings, a traumatic event such as the MSUT being moved and a varietyof other reasons.

Continuing with the flow diagram, in step S11, identifier 144 determineswhether a difference between the current offset and the reset offset(i.e., an offset difference) for a respective measurement system exceedsa difference threshold. The difference threshold may be anypredetermined offset difference value that is considered too large forthe measurement system to continue use. If the offset difference exceedsthe difference threshold, i.e., YES at step S11, then at step S12,identifier 144 identifies the measurement system for non-use. As shown,if the offset difference does not exceed the difference threshold, i.e.,NO at step S11 (FIG. 2B), or if steps S11-S12 are not used, processingmay then proceed to: perform steps S13-S14 (FIG. 2B) or, if those stepsare not provided, evaluate the next MSUT (FIG. 2A) by repeating themeasuring (step S2), replacing (step S3), calculating (steps S4-S7) andresetting (steps S8-S10) for each measurement system 90 of plurality ofmeasurement systems 91. If provided, steps S11 and S12 are repeated foreach measurement system 90.

Alternatively or in addition to steps S11-S12, steps S13-S14 may becarried out. In step S13, identifier 144 determines whether adelta-to-median value for a respective measurement system exceeds adelta-to-median threshold. The delta-to-median threshold may be anypredetermined delta-to-median value that is considered too large for themeasurement system to continue use. If the delta-to-median exceeds thedelta-to-median threshold, i.e., YES at step S13, then at step S14,identifier 144 identifies the measurement system for non-use. As shownin FIG. 2A, if the delta-to-median value does not exceed thedelta-to-median threshold, i.e., NO at step S13 (FIG. 2B), or if stepsS13-S14 are not used, processing may then proceed to evaluate the nextMSUT (FIG. 2A) by repeating the measuring (step S2), replacing (stepS3), calculating (steps S4-S7) and resetting (steps S8-S10) for eachmeasurement system 90 of plurality of measurement systems 91. Ifprovided, steps S13 and S14 are repeated for each measurement system 90.

As an alternative embodiment, as noted above, a user may select at leastone of the following: a number of test measurements used, i.e., in a setof test measurements 124, a maximum age of the test measurements used,and a lambda value based on at least one of the artifact and the MSUT.As another alternative, the above-described methodology may also berepeated for different artifacts 96.

Turning to FIGS. 3 and 4, some of the advantages of the above-describedembodiments will now be described. FIG. 3 shows a graph of mean averageof test measurements versus time according to prior art for four tools.The data in FIG. 3 is based on conventional tool matching approaches. Asillustrated, the mean averages of test measurements have excessivevariance for each tool over time. FIG. 4 shows a graph of mean averageof test measurement versus time according to the invention. Asillustrated, the mean average (excepting a few flier values due to othermeasurement system issues) are much more clustered along a horizontalline, i.e., at approximately 20.2 nm, for each measurement system. FIG.4 illustrates how one embodiment of the present invention compensatesfor long term apparent changes in artifact 96, e.g., monitor wafer gateoxide thickness variance, and allows the specification for measurementsystem matching to be improved upon by combining the measurementsystem's historical test measurement data with the offset. As a result,measurements made by a measurement system 90 are more stable over timeand allow system matching. In addition, if a MSUT's measurement isshifted and a current offset becomes inaccurate, the offset isdynamically changed by resetting it to a more accurate reset offset tomake the MSUT match again.

It is understood that the order of the above-described steps is onlyillustrative. To this extent, one or more steps may be performed inparallel, in a different order, at a remote time, etc. Further, one ormore of the steps may not be performed in various embodiments of theinvention.

While shown and described herein as a method and system for determiningan offset for each of a plurality of measurement systems, it isunderstood that the invention further provides various alternativeembodiments, and may be embodied in different forms of hardware and/orsoftware. For example, in one embodiment, the invention provides acomputer-readable medium that includes computer program code to enable acomputer infrastructure to determine an offset for each of a pluralityof measurement systems. To this extent, the computer-readable mediumincludes program code, such as offset determining system 106 (FIG. 1),which implements each of the various process steps of the invention. Itis understood that the term “computer-readable medium” comprises one ormore of any type of physical embodiment of the program code. Inparticular, the computer-readable medium can comprise program codeembodied on one or more portable storage articles of manufacture (e.g.,a compact disc, a magnetic disk, a tape, etc.), on one or more datastorage portions of a computing device, such as memory 112 (FIG. 1)and/or storage system 122 (FIG. 1) (e.g., a fixed disk, a read-onlymemory, a random access memory, a cache memory, etc.), and/or as a datasignal traveling over a network (e.g., during a wired/wirelesselectronic distribution of the program code).

In another embodiment, the invention provides a business method thatperforms the process steps of the invention on a subscription,advertising, and/or fee basis. That is, a service provider, such as anInternet Service Provider, could offer to determine an offset for eachof a plurality of measurement systems, as described above. In this case,the service provider can manage (e.g., create, maintain, support, etc.)a computer infrastructure, such as computer infrastructure 102 (FIG. 1),that performs the process steps of the invention for one or morecustomers. In return, the service provider can receive payment from thecustomer(s) under a subscription and/or fee agreement and/or the serviceprovider can receive payment from the sale of advertising space to oneor more third parties.

In still another embodiment, the invention provides a method ofgenerating a system for determining an offset for each of a plurality ofmeasurement systems. In this case, a computer infrastructure, such ascomputer infrastructure 102 (FIG. 1), can be obtained (e.g., created,maintained, having made available to, etc.) and one or more systems forperforming the process steps of the invention can be obtained (e.g.,created, purchased, used, modified, etc.) and deployed to the computerinfrastructure. To this extent, the deployment of each system cancomprise one or more of (1) installing program code on a computingdevice, such as computing device 104 (FIG. 1), from a computer-readablemedium; (2) adding one or more computing devices to the computerinfrastructure; and (3) incorporating and/or modifying one or moreexisting systems of the computer infrastructure, to enable the computerinfrastructure to perform the process steps of the invention.

As used herein, it is understood that the terms “program code” and“computer program code” are synonymous and mean any expression, in anylanguage, code or notation, of a set of instructions intended to cause acomputing device having an information processing capability to performa particular function either directly or after any combination of thefollowing: (a) conversion to another language, code or notation; (b)reproduction in a different material form; and/or (c) decompression. Tothis extent, program code can be embodied as one or more types ofprogram products, such as an application/software program, componentsoftware/a library of functions, an operating system, a basic I/Osystem/driver for a particular computing and/or I/O device, and thelike.

The foregoing description of various aspects of the invention has beenpresented for purposes of illustration and description. It is notintended to be exhaustive or to limit the invention to the precise formdisclosed, and obviously, many modifications and variations arepossible. Such modifications and variations that may be apparent to aperson skilled in the art are intended to be included within the scopeof the invention as defined by the accompanying claims.

1. A business method for determining an offset for each of a pluralityof measurement systems, the business method comprising: managing acomputer infrastructure that performs each of the following: obtaining aset of test measurements of an artifact on a monitor wafer for each ofthe plurality of measurement systems, and a current offset for eachmeasurement system, measuring the artifact on a measurement system undertest (MSUT) to obtain a new test measurement, adding the new testmeasurement to the set of test measurements for the MSUT, calculating anexponentially weighted moving average (EWMA) of each measurement systembased on their respective sets of test measurements, calculating foreach measurement system a prime value equal to the EWMA of a respectivemeasurement system plus the current offset of the respective measurementsystem, calculating a median of the prime values for the plurality ofmeasurement systems as a group, calculating for each measurement system,a delta-to-median value equal to the prime value for the respectivemeasurement system minus the median, and resetting the current offsetfor each respective measurement system to a reset offset equal to thecurrent offset for a respective measurement system minus thedelta-to-median for the respective measurement system in response to thedelta-to-median value for the respective measurement system exceeding apredetermined threshold; and receiving payment based on the managing. 2.The method of claim 21, wherein the resetting further includesmaintaining the current offset for the respective measurement system inresponse to the delta-to-median value for the respective measurementsystem not exceeding the predetermined threshold.
 3. The method of claim21, wherein the managing further comprises measuring, replacing,calculating and resetting for each measurement system of the pluralityof measurement systems.
 4. The method of claim 21, wherein the EWMAcalculating includes selecting at least one of the following: a numberof test measurements used, a maximum age of the test measurements used,and a lambda value based one at least one of the artifact and the MSUT.5. The method of claim 21, wherein each set of test measurementsincludes at least three test measurements.
 6. The method of claim 21,wherein the managing further comprises identifying a measurement systemfor non-use in response to at least one of the following: a) adifference of the current offset and the reset offset of the measurementsystem exceeding an offset difference threshold, and b) thedelta-to-median of the measurement system exceeding a delta-to-medianthreshold.